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Characterization of optical layers using UV-Vis/NIR spectroscopy

Available on demand

The precise characterization of optical layers requires the measurement of the transmission or reflection at variable angles of incidence with the help of UV-Vis/NIR spectroscopy. It is important that both the half cone angle of the sample beam and the size of the measuring spot can be adjusted to the requirements of the sample. After a short introduction, these possibilities will be presented in this webinar with a live demo with the Agilent Cary UMS.

Key learning objectives

General trends and challenges in optics and photonics
Measurement systems for characterizing optical layers
Live demo of a measurement of an edge filter
Influences of the measurement parameters on the precision of the measurement results

Who should attend?

Optical researchers
QA/QC UV-Vis users
Graduate students in optical research
Manufacturers of thin-film optics

Certificate of attendance
All webinar participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.

Speakers:

Travis Burt

Global Product Manager – Cary UV-Vis-NIR Spectrophotometers
Agilent Technologies
View Biography

Marcus Schulz

Application Engineer Molecular Spectroscopy
Agilent Technologies
View Biography

Blake Forman

Editorial Team
SelectScience
View Biography